Memory device with internal measurement of functional parameters

ABSTRACT

A non-volatile memory device may be integrated in a chip of semiconductor material. The memory device may include circuitry for receiving a measure instruction for obtaining a numerical measure value of a selected one among a plurality of predefined memory operations of the memory device. The memory device may also include circuitry for enabling the execution of the selected memory operation in response to the measure instruction. The execution of the selected memory operation may generate a corresponding result. The memory device may further include circuitry for providing at least one time signal, different from the corresponding result, relating to the execution of each memory operation, and circuitry for determining the measure value according to the at least one time signal of the selected memory operation.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. patent application Ser. No. 13/361,578, filed on Jan. 30, 2012, and entitled “Memory Device with Internal Measurement of Functional Parameters,” which application claims the benefit of Italian Patent Application No. MI2011A000120, filed on Jan. 31, 2011, which applications are hereby incorporated herein by reference.

FIELD OF THE INVENTION

The present invention relates to the field of electronics, and more specifically, to non-volatile memory devices.

BACKGROUND OF THE INVENTION

Non-volatile memory devices may be used in any application for storage of binary digits (or bits) of information that should be maintained even when the memory devices are not powered. An example of such devices are flash memory devices, each one of which typically includes a memory array, and peripheral circuits for functions of management and access thereto (such as, for example, decoder, reference voltage or band-gap generator, charge pumps).

At an appropriate phase of a production process of the memory device, the latter is generally subject to a parametric test to characterize the memory device, i.e. determine a measure value (or measure) of functional parameters thereof. The parametric test may represent a particularly burdensome aspect of the production process of the non-volatile memory devices, since it involves inefficiencies due to a reduced convenience and ease of measure where a relatively large number of functional parameters are to be measured.

For example, in a widely used approach, the parametric test is carried out through a technique known as electrical wafer sort (EWS). The parametric test implemented by the EWS technique is carried out on the memory devices yet included within a corresponding wafer of semiconductor material, and before the individual portions of the wafer on which the memory devices are integrated are diced into individual chips and embedded within respective packages.

The parametric test implemented by the EWS technique is executed on each memory device by automatic test equipment (ATE). The latter is provided with a test driver circuit (test driver) and a probe card including a plurality of conductive probes for contacting (operation called probing) corresponding conductive terminals (e.g., pads or pins) of the memory devices subject to the parametric test.

Typically, a test procedure (or routine) is run within the test driver to perform the parametric test. More particularly, such routine may include a memory instruction for the memory device, in response to which the latter performs a corresponding memory operation, and a sequence of test instructions, in response to which the test apparatus performs corresponding test operations for detecting a result of the memory operation and correspondingly determining the measure value of the functional parameter.

However, according to specific management protocols implemented within the memory device, each memory operation typically provides a result different in number and type (e.g., a voltage, a current, a string of bits, a synchronization signal, and the like). Thus, to characterize the memory device, it may be desirable, downstream from the memory operation, to process the result by specific auxiliary operative blocks (external and/or internal to the test apparatus) according to the functional parameter to be measured. Therefore, the test apparatus may be controlled by a specific routine for each functional parameter to be measured (for example, by configuring it to enable it to detect a determined type of result and/or a full reception of the same, or by setting it to allow the measurement of the functional parameter by exploiting the operative functional blocks within the test apparatus and/or external thereto).

For example, the characterization of the memory device by measuring functional parameters, such as band-gap time (time to generate the band-gap voltage), clock frequency of the charge pumps, and reading access time, may involve the implementation of corresponding routines different one to another. More specifically, to measure the band-gap time, the corresponding routine may provide the memory instruction to the memory device for performing the corresponding memory operation (band-gap voltage generation), and the test instruction to the test apparatus for monitoring an output terminal of the memory device (polling) until the complete reception of the result of the memory operation (band-gap voltage) and for enabling the measure of the band-gap time according to an elapsed polling time.

Instead, to measure the clock frequency of the charge pumps, the corresponding routine provides the memory instruction to the memory device for activating the charge pumps, and the test instruction to the test apparatus for enabling the test apparatus to receive the clock signal and provide the frequency value by exploiting proper circuits already present therein. Finally, to measure the reading time access, the corresponding routine provides the memory instruction to the memory device for performing a reading operation of a predefined memory address (typically provided together to the memory instruction), and the test instruction to the test apparatus for performing the polling to detect the result of the memory operation (read data) and controlling a detection block external to the test apparatus for enabling the measure of the access time (time interval between the sending of the predefined memory address and the arrival of the read data).

Therefore, the parametric test performed in this way provides for a continuous interaction with the test apparatus to set the latter according to the functional parameter to be measured. This makes the parametric test long and not efficient, and hence burdensome both in economic and practical terms for a manufacturer of the memory device.

SUMMARY OF THE INVENTION

The approach according to one or more embodiments of the present invention is based on the idea of implementing the measures within the memory device. In particular, one or more aspects of the approach according to specific embodiments of the invention are set out in the independent claims, with advantageous features of the same approach that are indicated in the dependent claims, (with any advantageous feature being provided with reference to a specific aspect of an embodiment of the invention that applies similarly to any other aspect thereof).

More specifically, an embodiment of the present invention may include a non-volatile memory device integrated in a chip of semiconductor material. The memory device includes means or circuitry for receiving a measure instruction for obtaining a numerical measure value of a selected one among a plurality of predefined memory operations of the memory device (for example, a measure instruction of the band-gap time, of the clock frequency of the charge pumps or of the reading access time). Means or circuitry may also be provided for enabling the execution of the selected memory operation in response to the measure instruction. The execution of the selected memory operation may generate a corresponding result (for example, generating the band-gap voltage, activating the charge pumps, or reading a datum).

The memory device may further include means or circuitry for providing at least one time signal, different from the corresponding result, relating to the execution of each memory operation (for example, a start signal and a stop signal of the generation of the band-gap voltage and of the data reading, or a clock signal of the charge pumps). Means or circuitry may also be provided for determining the measure value according to the at least one time signal of the selected memory operation (for example, the duration of the band-gap time or the reading access time).

Another embodiment of the present invention may include a test apparatus for performing a parametric test on one or more of such memory devices. A further embodiment of the present invention may be directed to a corresponding method.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic diagram of a test apparatus wherein an embodiment of the present invention may be applied.

FIG. 2 is a schematic diagram of a non-volatile memory device according to an embodiment of the present invention.

FIG. 3 is a schematic diagram of a circuit of a measure block of a memory device according to an embodiment of the present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

The approach according to one or more embodiments, as well as further features and the advantages thereof, will be best understood with reference to the following detailed description, given purely by way of a non-restrictive indication, to be read in conjunction with the accompanying drawings, wherein corresponding elements are denoted with equal or similar references, and their explanation is not repeated for the sake of exposition brevity.

With particular reference to FIG. 1, a test apparatus 100 is schematically illustrated wherein an embodiment may be applied. The test apparatus 100 may perform a parametric test on a plurality of non-volatile memory devices 105 (or simply memory devices, only one shown in the figure), to obtain a characterization thereof, i.e. to determine a measure value (or measure) of specific functional parameters. More particularly, the parametric test may be used for measuring a plurality of time functional parameters (e.g., band-gap time, reading access time, and clock frequency of charge pumps), each one associated (or associatable) with a corresponding predefined memory operation of the memory device 105 (e.g., generation of a band-gap voltage, reading of a memory address, and charge pumps activation, respectively).

The test apparatus 100 includes a test driver circuit (test driver) 110 for providing and receiving information in the form of electrical signals. In particular, the test apparatus 100 provides a measure instruction for obtaining a measure value of a corresponding memory operation within the memory device 105. To this end, the test driver no is coupled with input terminals T_(IN), only one shown for simplicity, and output terminals T_(OUT), only one shown for simplicity, of each memory device 105 through a coupling block 115 (e.g., a probe card, not shown in the figure, including a printed circuit board and a plurality of electrically conductive probes, such as for the EWS testing).

The measure instruction is typically encoded by a string of binary digits (or bits) according to a known communication protocol. The corresponding result is represented by a numeric value encoded by another string of bits.

Turning now to FIG. 2, a memory device 205 (e.g., a non-volatile memory device, such as a flash memory device) according to an embodiment is schematically illustrated. In the following, for the sake of exposition, brevity, and clarity, only functional blocks (relevant to the embodiment) directly or indirectly involved in the measure of significant functional parameters of the memory device 205 are introduced and described.

The memory device 205 includes, in addition to the terminal T_(IN) for receiving the measure instruction and to the terminal T_(OUT) for providing the measure value, a memory matrix 210 for storage purposes, and a plurality of peripheral circuits (not shown) for management and access thereto. The memory device 205 also includes a control block 215, which, by interfacing with the memory matrix 210 (connection not shown) and the peripheral circuits, generally controls functions of the memory device 205. For example, the control block 215 is able, in a known manner, to provide a plurality of time signals. The time signals may be logically divided into groups (of one or more time signals), each one of which is indicative of the execution of a corresponding selected memory operation (i.e., performed by the memory device 205 according to the measure instruction received at the terminal T_(IN)). Such time signals may include both status signals relating to a status of the execution of the selected memory operation, and synchronization signals (or clock signals) S_(CLOCKi) (with i=1, 2 . . . n).

More particularly, the status signals may include a set of start signals S_(STARTi) (with i=1, 2 . . . n), each one indicative of a start of the execution of a corresponding selected memory operation, and a plurality of stop signals S_(STOPi) (with i=1, 2 . . . n), each one indicative of a stop of the execution of a corresponding selected memory operation. Therefore, for each selected memory operation, the control block 215 may provide a pair of signals S_(STARTi), S_(STOPi) relating to the status of the execution of the selected memory operation and/or the signal S_(CLOCKi) relating to the synchronization of one or more of the peripheral circuits involved therein.

The memory device 205 may further include a measure block 220 for receiving the signals S_(STARTi), S_(STOPi), S_(CLOCKi) and determining the measure of the time parameter according to one or more of such signals S_(STARTi), S_(STOPi), S_(CLOCKi). Therefore, advantageously, the memory device 205 may provide the terminal T_(OUT) (and thus directly the test apparatus) with a numerical measure value of the functional parameter, and not the result of the corresponding selected memory operation (that would involve additional processing for obtaining the measure value from it).

Referring now to FIG. 3, a circuit implementation of the measure block 220 according to an embodiment is illustrated. The measure block 220 includes three multiplexers 225 a, 225 b and 225 c, each one having n input terminals, an output terminal, and a selection terminal. In particular, the multiplexer 225 a, 225 b, 225 c receives the signals S_(STARTi), S_(STOPi), S_(CLOCKi), respectively, at its input terminals and provides a selected one of such signals to its output terminal according to a corresponding selection signal S_(SELa), S_(SELb), S_(SELc) received at the selection terminal.

The measure block 220 further includes a logic inverter 230 a (for example, in CMOS logic) and another logic inverter 230 b similar to the logic inverter 230 a. The logic inverter 230 a, 230 b is connected to the output terminal of the multiplexer 225 a, 225 b for receiving the selected signal S_(STARTi), S_(STOPi) and providing a corresponding signal S_(STARTi) , S_(STOPi) negated with respect to the selected signal S_(STARTi), S_(STOPi).

The measure block 220 includes two further multiplexers 235 a and 235 b each one having two input terminals, an output terminal, and a selection terminal. In particular, an input terminal of the multiplexer 235 a, 235 b is connected to the output terminal of the multiplexer 225 a, 225 b, whereas the other input terminal of the multiplexer 235 a, 235 b is connected to the output terminal of the logic inverter 230 a, 230 b. In this way, the multiplexers 235 a and 235 b receive the signals S_(STARTi), S_(STARTi) , and the signals S_(STOPi), S_(STOPi) at the respective input terminals, and provide a selected one of such signals (which hereinafter will be referred to as a functional start signal denoted by the reference S_(STARTi)/S_(STARTi) , and a functional stop signal denoted by the reference S_(STOPi)/S_(STOPi) , respectively) to the respective output terminal according to a selection signal S_(SELap), S_(SELbp) received at the corresponding selection terminal. As will be explained more in detail in the following, the signal S_(SELap), S_(SELbp) depends on a polarity with which the selected signal S_(STARTi), S_(STOPi) has been implemented within the memory device.

The measure block 220 further includes a scaling block 240 having an input terminal for receiving the selected signal S_(CLOCKi), at a corresponding frequency (representing the functional parameter to be measured), and an output terminal for providing a functional synchronization signal S_(CLOCKi,u) at another frequency scaled with respect to the frequency of the selected signal S_(CLOCKi) by a suitable scaling factor. As will be explained in the following, the scaling factor is such that the frequency of the signal S_(CLOCKi,u) is compatible with a following counting operation. More specifically, such scaling factor depends on a ratio between a reference frequency of a reference synchronization signal S_(CLOCK,REF) (for example, a periodic signal generated outside the memory device) and an assumed value of the frequency of the selected signal S_(CLOCKi) (being known, since it may be theoretically close to the design value), which is adjustable within the scaling block 240 according to an appropriate regulation signal S_(REG).

The measure block 220 further includes a logic block 245 including three input terminals connected to the output terminal of the multiplexer 235 a, the output terminal of the multiplexer 235 b and the output terminal of the scaling block 240, respectively. The logic block 245 also includes a configuration terminal for receiving a configuration signal S_(CONFIG), and an output terminal for providing a counting signal S_(CON) according to the signals S_(STARTi)/S_(STARTi) , S_(STOPi)/S_(STOPi) , S_(CLOCKi,u) and S_(CONFIG).

The measure block 220 also includes an AND logic gate 250 (for example, in CMOS logic as well) having two input terminals and an output terminal, and a counter 255 of a known type connected to the output terminal of the AND logic gate 250 and coupled with the output terminal of the memory device (not shown) for providing the latter with the measure value of the time parameter. In particular, the AND logic gate 250 receives the signal S_(CON) at an input terminal thereof and the signal S_(CLOCK,REF) (used by the counter for counting) at the other input terminal. Finally, the measure block 220 includes a register block 260 for providing the signals S_(SEL), S_(SELb), S_(SELc), S_(SELap),S_(SELbp), S_(REG), S_(CONFIG) (electrical connections are not shown for the sake of simplicity) according to the selected memory operation.

The operating principle of the measure block 220 may be summarized as follows. As the memory device receives the measure instruction, the block 220 determines one between two possible configurations of the logic block 245 (according to the selected memory operation and according to a corresponding type of time functional parameter to be measured), i.e., a first configuration wherein the logic block 245 allows determining a duration of the selected memory operation, and a second configuration wherein the logic block 245 allows determining the clock frequency of one of the peripheral circuits of the memory device involved in the selected memory operation. This is performed by the register block 260, which, in response to the selected memory operation, asserts or de-asserts the signal S_(CONFIG) for setting the (common) logic block 245 in the first configuration or in the second configuration, respectively, (or vice-versa without that, this, as will be understood, may alter the operating principle). In case the signal S_(CONFIG) is asserted (first configuration), the register block 260 provides the signals S_(SELa), S_(SELb) to the multiplexers 225 a, 225 b for selecting the signals S_(STARTi), S_(STOPi) according to the memory operation defined within the measure instruction (e.g., band-gap voltage generation, reading of a predefined memory address, or the like).

Before the start of the execution of the selected operation, such signals S_(STARTi), S_(STOPi) are both de-asserted, but with a polarity that depends on how they have been implemented within the memory device (with the polarity information that is included within the register block 260). In general, the signals S_(STARTi) may be asserted, all or in part, at the high or low logic level, as well as the signals S_(STOPi) (with the signals S_(STOPi) that may also have not the same polarity as the corresponding signals S_(STARTi)). For this reason, according to the selected memory operation, the register block 260 provides the signals S_(SELap), S_(SELbp) at the appropriate value to allow the multiplexers 235 a and 235 b to select the signal S_(STARTi) or the signal S_(STARTi) and the signal S_(STOPi) or the signal S_(STOPi) , respectively, according to a polarity of the logic block 245. For example, since the latter may be implemented according to any combinatorial and/or sequential logic circuit without the principles of the present embodiments becoming limited, where the logic block 245 is implemented by using active high latches (not shown), the signals S_(SELap), S_(SELbp) may be such as to select one between the signal S_(STARTi) and the signal S_(STARTi) , and one between the signal S_(STOPi) and the signal S_(STOPi) that, at the start and stop of the selected memory operation, respectively, is asserted at the high logic level (and vice-versa in case of, for example, active low latches).

At this point, at the assertion of the signal S_(STARTi)/S_(STARTi) , the logic block 245 asserts the counting signal (for example, to the high logic level), so that the signal S_(CLOCK,REF) is received by the counter 255. The latter, in a known manner, performs a counting of the number of cycles of the signal S_(CLOCK,REF) within a counting interval. Such counting interval may be defined as the time interval between the assertion of the signal S_(STARTi)/S_(STARTi) and the assertion of the signal S_(STOPi)/S_(STOPi) (in other words, the logic block 245 latches the asserted signal S_(CON) until the end of the selected memory operation). In fact, when the signal S_(STOPi)/S_(STOPi) has been asserted, thereby indicating that the selected memory operation has ended, the logic block 245 de-asserts the signal S_(CON) (for example, to the low logic level). This also may force the output of the AND logic gate 250 down to the low logic level, thus causing the interruption of the counting by the counter 255.

At this point, the counter 255, whose counting is the measure value of the functional parameter, may send such measure value to the output terminal of the memory device, or process and/or store it for providing it later (e.g., at the end of the parametric test, possibly together with other measure values of the same or other memory operations).

When the signal S_(CONFIG) is de-asserted (second configuration), the register block 260 provides the signal S_(SELc) to the multiplexer 225 c for selecting the signal S_(CLOCKi) according to the selected memory operation (for example, activation of the charge pumps), and the signal S_(REG) to the multiplexer 235 a for providing the signal S_(CLOCKi,u) to the logic block 245 according to the scaling factor. In such second configuration, the logic block 245 may be sensitive to an edge of the received signal rather than a level thereof (such as in the first configuration). In particular, the logic block 245 asserts the signal S_(CON) in response to a switching (for example, a rise edge) of the signal S_(CLOCKi,u) (with such switching that, unless a possible phase shift introduced by the scaling block 240, corresponds to the switching of the selected signal S_(CLOCKi)). This involves the start of the counting (by the counter 255) of the number of cycles of the signal S_(CLOCK,REF) in a counting interval defined by a period of the signal S_(CLOCKi,u) (time distance between two identical successive switchings, i.e. two rising edges in the example at issue). In this case, the counting provides the value of the period of the signal S_(CLOCKi,u), from which it may be possible to obtain the frequency thereof and hence the frequency of the signal S_(CLOCKi) (e.g., by a suitable algebraic block, not shown, that computes the inverse of the period of the signal S_(CLOCKi,u), and performs an operation opposite to that of the scaling block 240).

It should be noted that the scaling factor may be such that the frequency of the signal S_(CLOCK,REF) is sufficiently greater than the frequency of the signal S_(CLOCKi,u) to ensure that the period of the signal S_(CLOCKi,u) includes a relatively high number (e.g., preferably from 10 to 100, still more preferably from 40 to 70, such as 55) of periods of the signal S_(CLOCK,REF) (and to allow a more accurate counting of the period of the signal S_(CLOCKi,u) and hence of the frequency thereof).

The described approach is particularly advantageous as it calculates the measured value of a plurality of functional parameters by using a single measure block within the memory device. This allows that, during the parametric test, the apparatus may not need either complex test instructions (as the measured numeric value, being able to be provided directly to the test apparatus from the memory device, needs no further processing) or dedicated routines for each measure parameter. Therefore, the described memory device allows performing parametric tests that, as not providing for continuous interactions with the test apparatus, have shorter durations and are more efficient, with advantages in both economic and practical terms.

Naturally, to satisfy local and specific requirements, a person skilled in the art may apply to the approach described above many logical and/or physical modifications and alterations. More specifically, although the present embodiments have been described with a certain degree of particularity, it should be understood that various omissions, substitutions and changes in the form and details as well as other embodiments are possible. In particular, different embodiments may even be practiced without the specific details (such as the numeric examples) set forth in the preceding description for providing a more thorough understanding thereof. On the contrary, well known features may have been omitted or simplified to not obscure the description with unnecessary particulars. Moreover, specific elements and/or method steps described in connection with any disclosed embodiment of the invention may be incorporated in any other embodiment as a matter of general design choice.

For example, analogous considerations may apply if the memory device has a different structure or includes equivalent components. In any case, any component thereof may be separated into several elements, or two or more components may be combined into a single element. Moreover, each component may be replicated for supporting the execution of the corresponding operations in parallel. It should also be noted that any interaction between different components generally does not need to be continuous (unless otherwise indicated), and it may be both direct and indirect through one or more intermediaries. For example, the memory device may be provided with more than one control block. Each peripheral circuit of the memory device may be provided with its own control block for monitoring the status during the execution of the selected memory operation and providing the corresponding start, stop and synchronization signals.

Moreover, although in the present description only two conductive terminals for exchanging electrical signals during the execution of the parametric test have been described and shown, the memory device may include several conductive terminals suitable for the purpose. For example, it may be possible to provide the use of an output terminal for providing the result of the operation, and further output terminals for providing the measure value and/or the start, stop and synchronization signals (for example, for using such signals in appropriate control algorithms for obtaining more precise measure values of the functional parameters). In addition, the memory device may store, in appropriate locations of the memory matrix or in properly configured registers, the measure values of a predefined number of functional parameters, and provide them (for example, serially through the output terminal) at the end (or at any phase) of the parametric test.

The memory device may be of the FLASH, EPROM, or E²PROM type. The multiplexers may be implemented according to any technology deemed appropriate and/or by using conceptually equivalent techniques (or they may also be omitted in the case of individual time signals).

The counter may be implemented in any useful manner, such as by flip-flops, and provide counting in binary, decimal, hexadecimal code, at 4 bits or 8 bits. The counter may also be provided with pins (for example, for zeroing it or selecting the type of code for the counting), accessible from outside of the memory device, or through the measure instruction.

In addition, the logic inverters may not be present, for example, where the control block of the memory device already provides the negated start signal and the negated stop signal, or be present in greater numbers. In the latter case, one or more inverter chains may be provided for reconstructing edges and levels of the start signals and of the stop signals, to avoid degradation thereof. The logic block may be made in combinatory or sequential logic, or a combination thereof.

The reference synchronization signal is not limiting for the present embodiments, and it may be any periodic signal (e.g., sine or square wave). Analogously, even the clock signals whose frequency it may be desirable to calculate (functional parameter) may be of a different type, or have reciprocally different swings. In the latter case, it may be possible to provide the use of circuits for making the swing of each synchronization signal uniform to the swing of the logic circuits (such as, for example, the one of the AND logic gate).

The measure block may also include a control element that allows updating, after the measure of each clock frequency, the values with respect to the assumed values (i.e., the design values) within the register block. In any case, the band-gap time, the reading access time, and the clock frequency represent respective merely illustrative measure types, and therefore they should not be constructed in a limiting way. In this respect, the described approach may also be applied to other similar measures (e.g., programming time, erasing time, rise and/or falling time of input signals, time of data transfer to registers from the memory matrix, and the like), or for further measure types. In the latter case, it should be noted that the logic block may be implemented to provide additional configurations for allowing such further measure types (with the configuration signal that may be a binary code with an appropriate number of bits).

Moreover, separate logical blocks may be provided for the different measure types (instead of a common one configurable in different way). Similar considerations apply if the test apparatus has a different structure or includes equivalent components (both separated to each other and combined together, in whole or in part).

It should be readily understood that the proposed structure may be part of the design of an integrated circuit. The design may also be created in a programming language. Moreover, if the designer does not manufacture the electronic devices or the masks, the design may be transmitted by physical means to others. In any case, the resulting integrated circuit may be distributed by its manufacturer in raw wafer form, as a bare die, or in packages. Moreover, the proposed structure may be integrated with other circuits in the same chip, or it may be mounted in intermediate products (such as mother boards) and coupled with one or more other chips (such as a processor). In any case, the integrated circuit is suitable to be used in complex systems (such as automotive applications).

Finally, the embodiments may be implemented through an equivalent method (by using similar steps, removing some steps being not essential, or adding further optional steps). Moreover, the steps may be performed in different order, concurrently or in an interleaved way (at least partly). 

What is claimed is:
 1. A memory device comprising a built-in-self test timing circuit configured to generate a numerical value indicative of a timing parameter within the memory device, the built-in-self test timing circuit comprising: a first selection circuit configured to select a start signal from a plurality of start signals, the start signal being indicative of a start of an execution of a first memory operation within the memory device; a second selection circuit configured to select a stop signal from a plurality of stop signals, the stop signal being indicative of an end of the execution of the first memory operation within the memory device; a third selection circuit configured to select a synchronization signal from a plurality of synchronization signals, the synchronization signal being indicative of a frequency of operation of a processing circuit configured to execute the first memory operation; and a controllable logic circuit configured to receive the start signal, the stop signal, and the synchronization signal, the controllable logic circuit being further configured to determine a time elapsed between a reception of the start signal and a reception of the stop signal when the controllable logic circuit is in a first mode, the controllable logic circuit being further configured to determine a period of the synchronization signal when the controllable logic circuit is in a second mode.
 2. The memory device of claim 1, wherein the controllable logic circuit comprises: logic circuitry configured to receive the start signal, the stop signal, and the synchronization signal, the logic circuitry being further configured to output a first counting signal between the reception of the start signal and the reception of the stop signal when the controllable logic circuit is in the first mode, the logic circuitry being further configured to output a second counting signal between consecutive falling edges or consecutive rising edges of the synchronization signal when the controllable logic circuit is in the second mode; and a control circuit configured to place the logic circuitry in the first mode or the second mode based on an instruction received by the memory device.
 3. The memory device of claim 2, wherein the controllable logic circuit further comprises: counting circuitry configured to receive a reference periodic signal, the counting circuitry being further configured to receive the first counting signal when the logic circuitry is in the first mode and to determine a number of cycles of the reference periodic signal present during a time the first counting signal is received by the counting circuitry.
 4. The memory device of claim 3, wherein the time between the reception of the start signal and the reception of the stop signal by the logic circuitry is configured to be greater than a period of the reference periodic signal.
 5. The memory device of claim 3, wherein the counting circuitry is further configured to receive the second counting signal when the logic circuitry is in the second mode and to determine a number of cycles of the reference periodic signal present during a time the second counting signal is received by the counting circuitry.
 6. The memory device of claim 5, wherein a frequency of the reference periodic signal is configured to be greater than a frequency of the synchronization signal.
 7. The memory device of claim 2, wherein the control circuit is further configured to generate a first selection signal and a second selection signal based on the instruction received by the memory device, the control circuit being further configured to provide the first selection signal and the second selection signal to the first selection circuit and the second selection circuit, respectively, the first selection signal and the second selection signal being configured to control a selection of the start signal and the stop signal by the first selection circuit and the second selection circuit, respectively.
 8. A memory device comprising a built-in-self test timing circuit configured to generate a numerical value indicative of a timing parameter within the memory device, the built-in-self test timing circuit comprising: a first selection circuit configured to select a first start signal from a plurality of start signals based on a first selection signal, the first start signal being indicative of a start of an execution of a first memory operation within the memory device; a second selection circuit configured to select a first stop signal from a plurality of stop signals based on a second selection signal, the first stop signal being indicative of an end of the execution of the first memory operation within the memory device; and a parameter measurement circuit configured operate in a first configuration and a second configuration different from the first configuration, the parameter measurement circuit being configured to receive the first start signal and the first stop signal and to determine a time elapsed between a reception of the first start signal and a reception of the first stop signal when the parameter measurement circuit is operating in the first configuration.
 9. The memory device of claim 8, wherein the built-in-self test timing circuit further comprises: a control circuit configured to place the parameter measurement circuit in the first configuration or the second configuration based on an instruction received by the memory device, the control circuit being further configured to generate the first selection signal and the second selection signal based on the instruction received by the memory device.
 10. The memory device of claim 8, wherein the parameter measurement circuit comprises: a first logic circuit configured to receive the first start signal and the first stop signal, the first logic circuit being further configured, when the parameter measurement circuit is operating in the first configuration, to start an output of a first counting signal in response to receiving the first start signal and to stop the output of the first counting signal in response to receiving the first stop signal; a second logic circuit configured to receive the first counting signal and to output a reference periodic signal in response to receiving the first counting signal; and a counter configured to determine a number of cycles of the reference periodic signal present during a time the first counting signal is received by the second logic circuit.
 11. The memory device of claim 10, wherein the built-in-self test timing circuit further comprises: a third selection circuit configured to select a first synchronization signal from a plurality of synchronization signals based on a third selection signal, the first synchronization signal being indicative of a frequency of operation of a processing circuit configured to execute the first memory operation, wherein the parameter measurement circuit is further configured to determine a period of a scaled version of the first synchronization signal when the parameter measurement circuit is operating in the second configuration.
 12. The memory device of claim ii, wherein the built-in-self test timing circuit further comprises a frequency scaling circuit configured to scale a frequency of the first synchronization signal to produce the scaled version of the first synchronization signal.
 13. The memory device of claim ii, wherein a frequency of the scaled version of the first synchronization signal is configured to be less than a frequency of the reference periodic signal.
 14. The memory device of claim 10, wherein a time between the reception of the first start signal and the reception of the first stop signal by the first logic circuit is configured to be greater than a period of the reference periodic signal.
 15. The memory device of claim 8, further comprising: processing circuitry configured to enable execution of the first memory operation; and a memory communicatively coupled with the processing circuitry.
 16. The memory device of claim 15, wherein the memory comprises a non-volatile memory.
 17. A method, comprising: receiving an instruction for execution of a first memory operation within a memory device; generating a first selection signal and a second selection signal based on the instruction; placing a parameter measurement circuit in a first mode or a second mode based on the instruction, the parameter measurement circuit being configured to determine a timing parameter; selecting a first start signal from a plurality of start signals based on the first selection signal, the first start signal being indicative of a start of an execution of the first memory operation; selecting a first stop signal from a plurality of stop signals based on the second selection signal, the first stop signal being indicative of an end of the execution of the first memory operation; providing the first start signal and the first stop signal to the parameter measurement circuit; and determining, by the parameter measurement circuit, a time elapsed between a reception of the first start signal and a reception of the first stop signal based on a reference period signal, when the parameter measurement circuit is in the first mode.
 18. The method of claim 17, further comprising: generating a third selection signal based on the instruction; selecting a synchronization signal from a plurality of synchronization signals based on the third selection signal, the synchronization signal being indicative of a frequency of operation of a processing circuit configured to execute the first memory operation; providing the synchronization signal to the parameter measurement circuit; and determining, by the parameter measurement circuit, a period of the synchronization signal based on the reference periodic signal, when the parameter measurement circuit is in the second mode.
 19. The method of claim 18, wherein a frequency of the synchronization signal is configured to be less than a frequency of the reference periodic signal.
 20. The method of claim 17, wherein a time between the reception of the first start signal and the reception of the first stop signal by the parameter measurement circuit is configured to be greater than a period of the reference periodic signal. 